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Yener Kuru

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Yener Kuru (2016)
Assoc. Prof. Dr.
Değerli hocamız Doç. Dr. Yener Kuru, 3 Nisan 2016 tarihinde vefat etmiştir. 

Education:

  • Research Experiences Max Planck Institute for Solid State Research (2008-2010), MIT (2010-2012)
  • Ph.D. Max Planck Institute for Metals Research and Stuttgart University, Germany (2008)
  • M.S. Sabanci University (2004)
  • B.S. Middle East Technical University (2002)

Research Interests:

  • Size-Dependent Properties in Metals and Oxides
  • In Situ X-Ray Diffraction
  • Residual Stress and Texture Analyes in Thin Films
  • Chemical Expansion in Complex Oxides
  • Novel Properties at Interfaces

Publications:

  • Chen Y., Cai Z., Kuru Y., Electronic Activation of Cathode Superlattices at Elevated Temperatures - Source of Markedly Accelerated Oxygen Reduction Kinetics, Advanced Energy Materials, 3 (2013) 1221-1229
  • Kuru Y, Jalili H, Cai Z, Yildiz B, Tuller HL, Direct Probing of Nano-Dimensioned Oxide Multilayers with Aid of Focused Ion Beam Milling, Advanced Materials, 23 (2011) 4543-4548
  • Cai Z, Kuru Y, Han JW, Chen Y, Yildiz B, Oxygen Vacancy-Driven Surface Electronic Structure on Strained La0.8Sr0.2CoO3 Thin Films at High Temperature, Journal of the American Chemical Society, 133 (2011) 17696-17704
  • Kuru Y, Bishop SR, Kim JJ, Yildiz B, Tuller HL, Chemomechanical Properties and Microstructural Stability of Nanocrystalline Pr-Doped Ceria: An In Situ X-Ray Diffraction Investigation, Solid State Ionics, 193 (2011) 1-4
  • Kuru Y, Wohlschlogel M, Welzel, Mittemeijer EJ, Large Excess Volume in Grain Boundaries of Stressed, Nanocrystalline Metallic Thin Films; Its Effect on Grain-Growth Kinetics, Applied Physics Letters, 95 (2009) 163112
  • Kuru Y, Wohlschlogel M, Welzel U, Mittemeijer EJ, Non-Ambient X-Ray Diffraction Residual Stress Analysis of Thin Films: Tracing Nanosize-Related Effects on Thermoelastic Constants and Identifying Sources of Residual Stresses, Journal of Applied Crystallography, 41 (2008) 428-435
  • Kuru Y, Welzel U, Wohlschlogel M, Mittemeijer EJ, Crystallite Size Dependence of Coefficient of Thermal Expansion in Thin Metal Films, Applied Physics Letters, 90 (2007) 243113
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