Max-width 100%
Yener Kuru (2016)
Assoc. Prof. Dr.

Değerli hocamız Doç. Dr. Yener Kuru, 3 Nisan 2016 tarihinde vefat etmiştir.
  • Research Experiences Max Planck Institute for Solid State Research (2008-2010), MIT (2010-2012)

  • Ph.D. Max Planck Institute for Metals Research and Stuttgart University, Germany (2008)
  • M.S. Sabanci University (2004)
  • B.S. Middle East Technical University (2002)
Research Interests:
  • Size-Dependent Properties in Metals and Oxides
  • In Situ X-Ray Diffraction
  • Residual Stress and Texture Analyes in Thin Films
  • Chemical Expansion in Complex Oxides
  • Novel Properties at Interfaces
  • Chen Y., Cai Z., Kuru Y., Electronic Activation of Cathode Superlattices at Elevated Temperatures - Source of Markedly Accelerated Oxygen Reduction Kinetics, Advanced Energy Materials, 3 (2013) 1221-1229
  • Kuru Y, Jalili H, Cai Z, Yildiz B, Tuller HL, Direct Probing of Nano-Dimensioned Oxide Multilayers with Aid of Focused Ion Beam Milling, Advanced Materials, 23 (2011) 4543-4548
  • Cai Z, Kuru Y, Han JW, Chen Y,Yildiz B, Oxygen Vacancy-DrivenSurfaceElectronicStructure on Strained La0.8Sr0.2CoO3ThinFilms at HighTemperature, Journal of the American Chemical Society, 133 (2011) 17696-17704
  • Kuru Y, Bishop SR, Kim JJ, Yildiz B, Tuller HL, ChemomechanicalPropertiesandMicrostructuralStability of NanocrystallinePr-DopedCeria: An InSitu X-Ray DiffractionInvestigation,SolidStateIonics, 193 (2011) 1-4
  • 4.Kuru Y, Wohlschlogel M, Welzel, Mittemeijer EJ, LargeExcessVolume in GrainBoundaries of Stressed, NanocrystallineMetallicThinFilms; ItsEffect on Grain-GrowthKinetics,AppliedPhysicsLetters, 95 (2009) 163112
  • Kuru Y, Wohlschlogel M, Welzel U, Mittemeijer EJ, Non-Ambient X-Ray DiffractionResidualStressAnalysis of ThinFilms: TracingNanosize-RelatedEffects on ThermoelasticConstantsandIdentifiyingSources of ResidualStresses, Journal of AppliedCrystallography, 41 (2008) 428-435
  • Kuru Y, Welzel U, Wohlschlogel M, Mittemeijer EJ, Crystallite Size Dependence of Coefficient of ThermalExpansion in Thin Metal Films, AppliedPhysicsLetters, 90 (2007) 243113

Last Updated:
02/09/2020 - 13:31